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Disambiguation of "Vanhooren, Ronny"

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Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers.

, , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (10): 3426-3435 (October 2023)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Ronny Leuschner

Reaktionsmechanismen von Legierungselementen beim rekristallisierenden Glühen zur Schmelztauchveredelung von Mehrphasenstählen. TU Aachen, (2007)

Ronny Sutarto

EuO and Gd-doped EuO thin films: epitaxial growth and properties. Uni Köln, (2009)

Ronny Kaden

Ronny Westerman

Ronny Baierl

 

Other publications of authors with the same name

Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis., , , , and . ITC, page 1-10. IEEE, (2016)ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits., , , , , and . IEEE Des. Test, 35 (3): 24-30 (2018)Automatic testing of analog ICs for latent defects using topology modification., , , , , and . ETS, page 1-6. IEEE, (2017)Automatic generation of autonomous built-in observability structures for analog circuits., , , , and . ETS, page 1-6. IEEE, (2015)Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (10): 3426-3435 (October 2023)Effective DC fault models and testing approach for open defects in analog circuits., , , , and . ITC, page 1-9. IEEE, (2016)DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (11): 4771-4781 (2022)Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs., , , , , , and . ITC, page 1-4. IEEE, (2019)A very low cost and highly parallel DfT method for analog and mixed-signal circuits., , , , , and . ETS, page 1-2. IEEE, (2017)Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing., , , , , and . ETS, page 1-6. IEEE, (2020)