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Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers.

, , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (10): 3426-3435 (октября 2023)

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Nektar Wartanian

 

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Methodology Towards Sub-ppm Testing of Analog and Mixed-Signal ICs for Cyber-Physical Systems., , , , , и . ISCAS, стр. 1-4. IEEE, (2018)ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits., , , , , и . IEEE Des. Test, 35 (3): 24-30 (2018)Review of Methodologies for Pre- and Post-Silicon Analog Verification in Mixed-Signal SOCs., , , и . DATE, стр. 1006-1009. IEEE, (2019)Automatic testing of analog ICs for latent defects using topology modification., , , , , и . ETS, стр. 1-6. IEEE, (2017)Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers., , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (10): 3426-3435 (октября 2023)DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value., , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (11): 4771-4781 (2022)Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs., , , , , , и . ITC, стр. 1-4. IEEE, (2019)Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing., , , , , и . ETS, стр. 1-6. IEEE, (2020)Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics., , , , , , , и . ETS, стр. 1-6. IEEE, (2020)A very low cost and highly parallel DfT method for analog and mixed-signal circuits., , , , , и . ETS, стр. 1-2. IEEE, (2017)