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Disambiguation of "Dobbelaere, Wim"

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Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers.

, , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (10): 3426-3435 (October 2023)

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Wim Wätjen

Wim Lutzke

Wim Broekaert

Wim Beyers

Wim Damen

 

Other publications of authors with the same name

ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits., , , , , and . IEEE Des. Test, 35 (3): 24-30 (2018)Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis., , , , and . ITC, page 1-10. IEEE, (2016)Innovative Practices on Automotive Test., , and . VTS, page 1. IEEE, (2019)Automatic testing of analog ICs for latent defects using topology modification., , , , , and . ETS, page 1-6. IEEE, (2017)Automatic generation of autonomous built-in observability structures for analog circuits., , , , and . ETS, page 1-6. IEEE, (2015)Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (10): 3426-3435 (October 2023)Effective DC fault models and testing approach for open defects in analog circuits., , , , and . ITC, page 1-9. IEEE, (2016)DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (11): 4771-4781 (2022)Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs., , , , , , and . ITC, page 1-4. IEEE, (2019)Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing., , , , , and . ETS, page 1-6. IEEE, (2020)