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Disambiguation of "Pomeranz, Irith"

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Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set.

. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (4): 1336-1345 (April 2023)

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Irith Baumann

Irith Wiegand

Irith Bittmann

Alexander Pomeranz

Irith Bittmann

 

Other publications of authors with the same name

On output response compression in the presence of unknown output values., , and . DAC, page 255-258. ACM, (2002)Diagnosis of transition fault clusters.. DAC, page 429-434. ACM, (2011)Generation of close-to-functional broadside tests with equal primary input vectors.. DAC, page 137:1-137:6. ACM, (2015)Computation of Seeds for LFSR-Based n-Detection Test Generation.. ACM Trans. Design Autom. Electr. Syst., 22 (2): 29:1-29:13 (2017)Test Modification for Reduced Volumes of Fail Data., , and . ACM Trans. Design Autom. Electr. Syst., 22 (4): 67:1-67:17 (2017)Generation of Transparent-Scan Sequences for Diagnosis of Scan Chain Faults.. ACM Trans. Design Autom. Electr. Syst., 22 (3): 43:1-43:17 (2017)FOLD: Extreme Static Test Compaction by Folding of Functional Test Sequences.. ACM Trans. Design Autom. Electr. Syst., 20 (4): 57:1-57:19 (2015)Partitioned n-detection test generation., and . ACM Great Lakes Symposium on VLSI, page 93-98. ACM, (2009)Definition and application of approximate necessary assignments., and . ACM Great Lakes Symposium on VLSI, page 105-108. ACM, (2009)ITEM: an iterative improvement test generation procedure for synchronous sequential circuits., and . ACM Great Lakes Symposium on VLSI, page 13-18. ACM, (2001)