%0 Journal Article %1 journals/tcad/Pomeranz23a %A Pomeranz, Irith %D 2023 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 4 %P 1336-1345 %T Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set. %U http://dblp.uni-trier.de/db/journals/tcad/tcad42.html#Pomeranz23a %V 42

@article{journals/tcad/Pomeranz23a, added-at = {2023-04-16T00:00:00.000+0200}, author = {Pomeranz, Irith}, biburl = {https://www.bibsonomy.org/bibtex/295adbf3ba79706dca978facbb414a92f/dblp}, ee = {https://doi.org/10.1109/TCAD.2022.3193902}, interhash = {9519636c3858bc60e7c61fd04609908c}, intrahash = {95adbf3ba79706dca978facbb414a92f}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, month = {April}, number = 4, pages = {1336-1345}, timestamp = {2024-04-08T19:47:24.000+0200}, title = {Functionally Possible Scan-Based Test Set as a Dual of a Compressed Multicycle Test Set.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad42.html#Pomeranz23a}, volume = 42, year = 2023 }