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Single-Event Multiple-Transient Characterization and Mitigation via Alternative Standard Cell Placement Methods., , и . ACM Trans. Design Autom. Electr. Syst., 20 (4): 60:1-60:22 (2015)Effects of Voltage and Temperature Variations on the Electrical Masking Capability of Sub-65 nm Combinational Logic Circuits., , и . DFT, стр. 1-6. IEEE Computer Society, (2018)FL-IDS: Federated Learning-Based Intrusion Detection System Using Edge Devices for Transportation IoT., , , , и . IEEE Access, (2024)An efficient technique to select logic nodes for single event transient pulse-width reduction., , , , , , и . Microelectron. Reliab., 53 (1): 114-117 (2013)Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies., , , , и . DFT, стр. 1-4. IEEE, (2022)Stealth assessment of hardware Trojans in a microcontroller., , , , и . ICCD, стр. 139-142. IEEE Computer Society, (2012)Athena - The NSF AI Institute for Edge Computing., , , , , , , , и . AI Mag., 45 (1): 15-21 (2024)Design and Implementation of an Autonomous Wireless Sensor-Based Smart Home., , , , и . ICCCN, стр. 1-7. IEEE, (2015)A Survey of QEMU-Based Fault Injection Tools & Techniques for Emulating Physical Faults., , и . IEEE Access, (2023)Power benefit study for ultra-high density transistor-level monolithic 3D ICs., , и . DAC, стр. 104:1-104:10. ACM, (2013)