%0 Journal Article %1 journals/mr/DongWWLGYHXSW12 %A Dong, Zhihua %A Wang, Jinyan %A Wen, Cheng P. %A Liu, Shenghou %A Gong, Rumin %A Yu, Min %A Hao, Yilong %A Xu, Fujun %A Shen, Bo %A Wang, Yangyuan %D 2012 %J Microelectron. Reliab. %K dblp %N 2 %P 434-438 %T High temperature induced failure in Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructure. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#DongWWLGYHXSW12 %V 52

@article{journals/mr/DongWWLGYHXSW12, added-at = {2023-09-30T00:00:00.000+0200}, author = {Dong, Zhihua and Wang, Jinyan and Wen, Cheng P. and Liu, Shenghou and Gong, Rumin and Yu, Min and Hao, Yilong and Xu, Fujun and Shen, Bo and Wang, Yangyuan}, biburl = {https://www.bibsonomy.org/bibtex/2e00b702d24e80821658d1c800a273b1a/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.09.021}, interhash = {c43ad729e25d72de41760c05ae81063c}, intrahash = {e00b702d24e80821658d1c800a273b1a}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 2, pages = {434-438}, timestamp = {2024-04-09T02:50:29.000+0200}, title = {High temperature induced failure in Ti/Al/Ni/Au Ohmic contacts on AlGaN/GaN heterostructure.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#DongWWLGYHXSW12}, volume = 52, year = 2012 }