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Disambiguation of "Zanoni, Enrico"

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Modeling of Substrate Noise Injected by Digital Libraries.

, , , , , , , and . ISQED, page 488-492. IEEE Computer Society, (2001)

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Zanoni Dias

Ivo Zanoni

Reto Giacomi Zanoni

Enrico Meier

Enrico Körner

 

Other publications of authors with the same name

Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields., , , , , , , and . Microelectron. Reliab., 48 (8-9): 1370-1374 (2008)Charge Trapping in GaN Power Transistors: Challenges and Perspectives., , , , , , , , , and 1 other author(s). BCICTS, page 1-4. IEEE, (2021)Modeling of Substrate Noise Injected by Digital Libraries., , , , , , , and . ISQED, page 488-492. IEEE Computer Society, (2001)Degradation of dc and pulsed characteristics of InAlN/GaN HEMTs under different proton fluences., , , , , , , , , and 4 other author(s). ESSDERC, page 381-384. IEEE, (2014)Impact of field-plate geometry on the reliability of GaN-on-SiC HEMTs., , , , , , , and . Microelectron. Reliab., 53 (9-11): 1461-1465 (2013)"Hot-plugging" of LED modules: Electrical characterization and device degradation., , , , , , and . Microelectron. Reliab., 53 (9-11): 1524-1528 (2013)Traps localization and analysis in GaN HEMTs., , , , and . Microelectron. Reliab., 54 (9-10): 2222-2226 (2014)Continuous time-domain RF waveforms monitoring under overdrive stress condition of AlGaN/GaN HEMTs., , , , , , and . Microelectron. Reliab., (2016)Failure signatures on 0.25 μm GaN HEMTs for high-power RF applications., , , , , , , , and . Microelectron. Reliab., 54 (9-10): 2237-2241 (2014)Long-term degradation mechanisms of mid-power LEDs for lighting applications., , , , , and . Microelectron. Reliab., 55 (9-10): 1754-1758 (2015)