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Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers.

, , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (10): 3426-3435 (October 2023)

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A novel operating-point driven method for the sizing of analog IC., , , and . ISCAS, page 781-784. IEEE, (2011)Modeling of the Power-supply Interactions of CMOS Operational Amplifiers Using Symbolic Computation., and . ISCAS, page 1381-1384. IEEE, (1993)Efficient simulation model for DAC dynamic properties., and . ISCAS, page 2896-2899. IEEE, (2010)Sparse ε-tube support vector regression by active learning., , and . Soft Comput., 18 (6): 1113-1126 (2014)Automatic testing of analog ICs for latent defects using topology modification., , , , , and . ETS, page 1-6. IEEE, (2017)An intelligent design system for analogue integrated circuits., , and . EURO-DAC, page 169-173. IEEE Computer Society, (1990)Architectural Analysis of a Novel Closed-Loop VCO-Based 1-1 Sturdy MASH Sensor-to-Digital Converter., , and . SMACD, page 261-264. IEEE, (2019)Impact of transistor aging on RF low noise amplifier performance of 28nm technology: Reliability assessment., and . ICECS, page 413-416. IEEE, (2013)A column-and-row-parallel CMOS image sensor with thermal and 1/f noise suppression techniques., , and . ESSCIRC, page 221-224. IEEE, (2016)Optimal Design Methodology for High-Order Continuous-Time Wideband Delta-Sigma Converters., , , , , and . ICECS, page 743-746. IEEE, (2007)