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Disambiguation of "Jeong, Myong K."

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A generalised uncertain decision tree for defect classification of multiple wafer maps.

, , , and . Int. J. Prod. Res., 58 (9): 2805-2821 (2020)

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Myong-Kee Jeong

Myong Ja Jung-Baek

Su-Jeong Jeong

Wonrae Jeong

Hyung-Gon Jeong

 

Other publications of authors with the same name

Monitoring variations in multimode surface topography., , and . Int. J. Prod. Res., 61 (4): 1129-1145 (February 2023)A generalised uncertain decision tree for defect classification of multiple wafer maps., , , and . Int. J. Prod. Res., 58 (9): 2805-2821 (2020)Regularized asymmetric nonnegative matrix factorization for clustering in directed networks., , , and . Pattern Recognit. Lett., (2019)A Vertical-Energy-Thresholding Procedure for Data Reduction With Multiple Complex Curves., , and . IEEE Trans. Syst. Man Cybern. Part B, 36 (5): 1128-1138 (2006)Generalised spatially weighted autocorrelation approach for monitoring and diagnosing faults in 3D topographic surfaces., , and . Int. J. Prod. Res., 61 (2): 541-558 (January 2023)Multi-Label Separation-Deviation Surface Model for Detecting Spatial Defects in Topographic Surfaces., , and . IEEE Trans. Ind. Informatics, 17 (7): 4555-4565 (2021)Robust Kriging models in computer experiments., , , , and . J. Oper. Res. Soc., 67 (4): 644-653 (2016)Evolutionary refinement approaches for band selection of hyperspectral images with applications to automatic monitoring of animal feed quality., , , , , , and . Intell. Data Anal., 18 (1): 25-42 (2014)Recursive support vector censored regression for monitoring product quality based on degradation profiles., and . Appl. Intell., 35 (1): 63-74 (2011)Comparisons of classification methods in the original and pattern spaces., , , and . Expert Syst. Appl., 38 (10): 12432-12438 (2011)