%0 Journal Article %1 journals/et/BhuniaMRR08 %A Bhunia, Swarup %A Mahmoodi, Hamid %A Raychowdhury, Arijit %A Roy, Kaushik %D 2008 %J J. Electron. Test. %K dblp %N 6 %P 577-590 %T Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique. %U http://dblp.uni-trier.de/db/journals/et/et24.html#BhuniaMRR08 %V 24

@article{journals/et/BhuniaMRR08, added-at = {2024-05-07T00:00:00.000+0200}, author = {Bhunia, Swarup and Mahmoodi, Hamid and Raychowdhury, Arijit and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/29e36d8e91dd552eccb1ca3bb02aa4bf5/dblp}, ee = {https://doi.org/10.1007/s10836-008-5072-4}, interhash = {2334d0fd104562a313aa66fc28eff4b5}, intrahash = {9e36d8e91dd552eccb1ca3bb02aa4bf5}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 6, pages = {577-590}, timestamp = {2024-05-13T07:29:33.000+0200}, title = {Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique.}, url = {http://dblp.uni-trier.de/db/journals/et/et24.html#BhuniaMRR08}, volume = 24, year = 2008 }