Article,

ADC Histogram Test Using Triangular Stimulus Signals

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Global Journal of Engineering and Technology Advances, 16 (3): 121–133 (February 2024)
DOI: 10.30574/gjeta.2023.16.3.0188

Abstract

This paper focuses on tackling the uncertainty in ADC testing estimates using the Histogram Method with a triangular stimulus instead of a sinusoidal one as is standard practice. It introduces expressions to calculate the standard deviation of transition voltages and code bin widths.

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