Article,

Excitation and recombination dynamics of vacancy-related spin centers in silicon carbide

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Journal of Applied Physics, 115 (13): 133508-- (April 2014)
DOI: 10.1063/1.4870456

Abstract

We generate silicon vacancy related defects in high-quality epitaxial silicon carbide layers by means of electron irradiation. By controlling the irradiation fluence, the defect concentration is va...

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