%0 Journal Article %1 journals/ijpr/KimJTJ20 %A Kim, Byunghoon %A Jeong, Young-Seon %A Tong, Seung Hoon %A Jeong, Myong K. %D 2020 %J Int. J. Prod. Res. %K dblp %N 9 %P 2805-2821 %T A generalised uncertain decision tree for defect classification of multiple wafer maps. %U http://dblp.uni-trier.de/db/journals/ijpr/ijpr58.html#KimJTJ20 %V 58

@article{journals/ijpr/KimJTJ20, added-at = {2024-03-25T00:00:00.000+0100}, author = {Kim, Byunghoon and Jeong, Young-Seon and Tong, Seung Hoon and Jeong, Myong K.}, biburl = {https://www.bibsonomy.org/bibtex/2220fa7c396b9aa0791b256a9b51c9a51/dblp}, ee = {https://doi.org/10.1080/00207543.2019.1637035}, interhash = {0cd1696076f9e8cf4af0a679eeeb61c6}, intrahash = {220fa7c396b9aa0791b256a9b51c9a51}, journal = {Int. J. Prod. Res.}, keywords = {dblp}, number = 9, pages = {2805-2821}, timestamp = {2024-04-08T11:08:06.000+0200}, title = {A generalised uncertain decision tree for defect classification of multiple wafer maps.}, url = {http://dblp.uni-trier.de/db/journals/ijpr/ijpr58.html#KimJTJ20}, volume = 58, year = 2020 }