Several methods can be used to obtain, from powder diffraction patterns,
crystallite size and lattice strain of polycrystalline samples. Some
examples are the Scherrer equation, Williamson-Hall plots,
Warren/Averbach Fourier decomposition, Whole Powder Pattern Modeling,
and Debye function analysis. To apply some of these methods, it is
necessary to remove the contribution of the instrument to the widths of
the diffraction peaks. Nowadays, one of the main samples used for this
purpose is the LaB6 SRM660b commercialized by the National Institute of
Standard Technology; the width of the diffraction peak of this sample is
caused only by the instrumental apparatus. However, this sample can be
expensive for researchers in developing countries. In this work, the
authors present a simple route to obtain micron-sized polycrystalline
CeO2 that have a full width at half maximum comparable with the SRM660b
and therefore it can be used to remove instrumental broadening. (C) 2018
International Centre for Diffraction Data.
%0 Journal Article
%1 WOS:000428216900005
%A de Lima Batista, Anderson Marcio
%A Miranda, Marcus Aurelio Ribeiro
%A Martins, Fatima Itana Chaves Custodio
%A Santos, Cassio Morilla
%A Sasaki, Jose Marcos
%C 12 CAMPUS BLVD, NEWTOWN SQ, PA 19073-3273 USA
%D 2018
%I J C P D S-INT CENTRE DIFFRACTION DATA
%J POWDER DIFFRACTION
%K broadening} cerium diffraction; instrumental material; oxide; reference standard {X-ray
%N 1
%P 21-25
%R 10.1017/S0885715617001208
%T Synthesis of cerium oxide (CeO2) by co-precipitation for application as
a reference material for X-ray powder diffraction peak widths
%V 33
%X Several methods can be used to obtain, from powder diffraction patterns,
crystallite size and lattice strain of polycrystalline samples. Some
examples are the Scherrer equation, Williamson-Hall plots,
Warren/Averbach Fourier decomposition, Whole Powder Pattern Modeling,
and Debye function analysis. To apply some of these methods, it is
necessary to remove the contribution of the instrument to the widths of
the diffraction peaks. Nowadays, one of the main samples used for this
purpose is the LaB6 SRM660b commercialized by the National Institute of
Standard Technology; the width of the diffraction peak of this sample is
caused only by the instrumental apparatus. However, this sample can be
expensive for researchers in developing countries. In this work, the
authors present a simple route to obtain micron-sized polycrystalline
CeO2 that have a full width at half maximum comparable with the SRM660b
and therefore it can be used to remove instrumental broadening. (C) 2018
International Centre for Diffraction Data.
@article{WOS:000428216900005,
abstract = {Several methods can be used to obtain, from powder diffraction patterns,
crystallite size and lattice strain of polycrystalline samples. Some
examples are the Scherrer equation, Williamson-Hall plots,
Warren/Averbach Fourier decomposition, Whole Powder Pattern Modeling,
and Debye function analysis. To apply some of these methods, it is
necessary to remove the contribution of the instrument to the widths of
the diffraction peaks. Nowadays, one of the main samples used for this
purpose is the LaB6 SRM660b commercialized by the National Institute of
Standard Technology; the width of the diffraction peak of this sample is
caused only by the instrumental apparatus. However, this sample can be
expensive for researchers in developing countries. In this work, the
authors present a simple route to obtain micron-sized polycrystalline
CeO2 that have a full width at half maximum comparable with the SRM660b
and therefore it can be used to remove instrumental broadening. (C) 2018
International Centre for Diffraction Data.},
added-at = {2022-05-23T20:00:14.000+0200},
address = {12 CAMPUS BLVD, NEWTOWN SQ, PA 19073-3273 USA},
author = {de Lima Batista, Anderson Marcio and Miranda, Marcus Aurelio Ribeiro and Martins, Fatima Itana Chaves Custodio and Santos, Cassio Morilla and Sasaki, Jose Marcos},
biburl = {https://www.bibsonomy.org/bibtex/2eea5fa6e08abfccc78f255f4170dec53/ppgfis_ufc_br},
doi = {10.1017/S0885715617001208},
interhash = {7440054e64cafad743328d10474e9527},
intrahash = {eea5fa6e08abfccc78f255f4170dec53},
issn = {0885-7156},
journal = {POWDER DIFFRACTION},
keywords = {broadening} cerium diffraction; instrumental material; oxide; reference standard {X-ray},
number = 1,
pages = {21-25},
publisher = {J C P D S-INT CENTRE DIFFRACTION DATA},
pubstate = {published},
timestamp = {2022-05-23T20:00:14.000+0200},
title = {Synthesis of cerium oxide (CeO2) by co-precipitation for application as
a reference material for X-ray powder diffraction peak widths},
tppubtype = {article},
volume = 33,
year = 2018
}