%0 Conference Paper %1 conf/itc/StroudSGH04 %A Stroud, Charles E. %A Sunwoo, John %A Garimella, Srinivas M. %A Harris, Jonathan %B ITC %D 2004 %I IEEE Computer Society %K dblp %P 837-846 %T Built-In Self-Test for System-on-Chip: A Case Study. %U http://dblp.uni-trier.de/db/conf/itc/itc2004.html#StroudSGH04 %@ 0-7803-8581-0

@inproceedings{conf/itc/StroudSGH04, added-at = {2023-03-23T00:00:00.000+0100}, author = {Stroud, Charles E. and Sunwoo, John and Garimella, Srinivas M. and Harris, Jonathan}, biburl = {https://www.bibsonomy.org/bibtex/2e403ea69c33bf014c9d23912e02b7604/dblp}, booktitle = {ITC}, crossref = {conf/itc/2004}, ee = {https://doi.ieeecomputersociety.org/10.1109/ITC.2004.46}, interhash = {a2a50b8414ede72e902b2c54f45efa1d}, intrahash = {e403ea69c33bf014c9d23912e02b7604}, isbn = {0-7803-8581-0}, keywords = {dblp}, pages = {837-846}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:27:43.000+0200}, title = {Built-In Self-Test for System-on-Chip: A Case Study.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2004.html#StroudSGH04}, year = 2004 }